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X-ray Inspection
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Gas Leak Detector
VIEW Micro-Metrology
Optical Metrology Systems
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Coating Thickness Measurement
Handheld XRF
Survey Meter
XRF / Gold Check
X-ray Inspection
Dust Control & Static Control
Dust Control (No Wind)
Static Control
Measurement
Coating Thickness - Magnetic Induction / Eddy Current
Porosity / Holidays Detector - High Voltage
Ferrite Measurement
Moisture Meter
Couloumetric
Ultrasonic Thickness Gauge
Aviation NDT
Probes
Reference Standard
Transducer
Laser Marking System
Fiber Laser Marking Machine
CO2 Laser Marking Machine
UV Laser Marking Machine
Certified Comparator Products
Profile Projector
Leak Testing
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Burst Testing
Crack Testing
Occlusion Testing
Vacuum Leak Testing
SF6
Gas Leak Detector
VIEW Micro-Metrology
Optical Metrology Systems
Eddy Current Flaw & Crack Test
Criterion NDT CR-11
Criterion NDT ST-11
Zetec Insite
X-Ray
Calibration Standard
Coating Thickness Measurement
Handheld XRF
Survey Meter
XRF / Gold Check
X-ray Inspection
Dust Control & Static Control
Dust Control (No Wind)
Static Control
Measurement
Coating Thickness – Magnetic Induction / Eddy Current
Porosity / Holidays Detector – High Voltage
Ferrite Measurement
Moisture Meter
Couloumetric
Ultrasonic Thickness Gauge
Aviation NDT
Probes
Reference Standard
Transducer
Laser Marking System
Fiber Laser Marking Machine
CO2 Laser Marking Machine
UV Laser Marking Machine
Certified Comparator Products
Profile Projector
Menu
Leak Testing
Air Leak Testing
Burst Testing
Crack Testing
Occlusion Testing
Vacuum Leak Testing
SF6
Gas Leak Detector
VIEW Micro-Metrology
Optical Metrology Systems
Eddy Current Flaw & Crack Test
Criterion NDT CR-11
Criterion NDT ST-11
Zetec Insite
X-Ray
Calibration Standard
Coating Thickness Measurement
Handheld XRF
Survey Meter
XRF / Gold Check
X-ray Inspection
Dust Control & Static Control
Dust Control (No Wind)
Static Control
Measurement
Coating Thickness – Magnetic Induction / Eddy Current
Porosity / Holidays Detector – High Voltage
Ferrite Measurement
Moisture Meter
Couloumetric
Ultrasonic Thickness Gauge
Aviation NDT
Probes
Reference Standard
Transducer
Laser Marking System
Fiber Laser Marking Machine
CO2 Laser Marking Machine
UV Laser Marking Machine
Certified Comparator Products
Profile Projector
Jewel Box 90T
JewelBox 70T & 90T
for μBGAs, flip chips, ICs and other advanced components
JewelBox Ultra Compact
High resolution, real-time, x-ray inspection capability
RTX-113T
A unique X-ray inspection system, designed for rapid, reliable inspection of both multi-layer and assembled printed circuit boards
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About
ANIRES TECH Sdn Bhd
200801018419 (819715-V)
was incorporated in Malaysia in year 2008. Since its establishment, the company has consistently adhered to the policy of providing the best sales & technical support to our discerning customers.
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sales@anirestech.com
+6012-498 3908
+6016-211 1918
+60389581918
+60389581916
Business Hour 8.30AM - 5.30PM (GMT +8)
© 2021, Anires Tech SDN BHD
200801018419 (819715-V)