Skip to content
Anirestech
Home
About Us
Products
Exhibition
Contact Us
Optical Metrology Systems
Leak Testing
Air Leak Testing
Burst Testing
Crack Testing
Occlusion Testing
Vacuum Leak Testing
SF6
Gas Leak Detector
VIEW Micro-Metrology
Optical Metrology Systems
Eddy Current Flaw & Crack Test
Criterion NDT CR-11
Criterion NDT ST-11
Zetec Insite
X-Ray
Calibration Standard
Coating Thickness Measurement
Handheld XRF
Survey Meter
XRF / Gold Check
X-ray Inspection
Dust Control & Static Control
Dust Control (No Wind)
Static Control
Measurement
Coating Thickness - Magnetic Induction / Eddy Current
Porosity / Holidays Detector - High Voltage
Ferrite Measurement
Moisture Meter
Couloumetric
Ultrasonic Thickness Gauge
Aviation NDT
Probes
Reference Standard
Transducer
Laser Marking System
Fiber Laser Marking Machine
CO2 Laser Marking Machine
UV Laser Marking Machine
Certified Comparator Products
Profile Projector
Leak Testing
Air Leak Testing
Burst Testing
Crack Testing
Occlusion Testing
Vacuum Leak Testing
SF6
Gas Leak Detector
VIEW Micro-Metrology
Optical Metrology Systems
Eddy Current Flaw & Crack Test
Criterion NDT CR-11
Criterion NDT ST-11
Zetec Insite
X-Ray
Calibration Standard
Coating Thickness Measurement
Handheld XRF
Survey Meter
XRF / Gold Check
X-ray Inspection
Dust Control & Static Control
Dust Control (No Wind)
Static Control
Measurement
Coating Thickness – Magnetic Induction / Eddy Current
Porosity / Holidays Detector – High Voltage
Ferrite Measurement
Moisture Meter
Couloumetric
Ultrasonic Thickness Gauge
Aviation NDT
Probes
Reference Standard
Transducer
Laser Marking System
Fiber Laser Marking Machine
CO2 Laser Marking Machine
UV Laser Marking Machine
Certified Comparator Products
Profile Projector
Menu
Leak Testing
Air Leak Testing
Burst Testing
Crack Testing
Occlusion Testing
Vacuum Leak Testing
SF6
Gas Leak Detector
VIEW Micro-Metrology
Optical Metrology Systems
Eddy Current Flaw & Crack Test
Criterion NDT CR-11
Criterion NDT ST-11
Zetec Insite
X-Ray
Calibration Standard
Coating Thickness Measurement
Handheld XRF
Survey Meter
XRF / Gold Check
X-ray Inspection
Dust Control & Static Control
Dust Control (No Wind)
Static Control
Measurement
Coating Thickness – Magnetic Induction / Eddy Current
Porosity / Holidays Detector – High Voltage
Ferrite Measurement
Moisture Meter
Couloumetric
Ultrasonic Thickness Gauge
Aviation NDT
Probes
Reference Standard
Transducer
Laser Marking System
Fiber Laser Marking Machine
CO2 Laser Marking Machine
UV Laser Marking Machine
Certified Comparator Products
Profile Projector
BENCHMARK 250
High Speed Optical Metrology System
Pinnacle™ 250
High Throughout, High Accuracy Metrology System
Summit™ 800
Very Large Area, High Accuracy Dimensional Metrology System
BENCHMARK 1500
High Speed Optical Metrology System
Microline™ AF
Automated Critical Dimension Metrology System
Microline™ AF Plus
Automated Critical Dimension Metrology System
1
2
»
Site Map
Home
About Us
Products
Exhibition
Contact Us
Home
About Us
Products
Exhibition
Contact Us
About
ANIRES TECH Sdn Bhd
200801018419 (819715-V)
was incorporated in Malaysia in year 2008. Since its establishment, the company has consistently adhered to the policy of providing the best sales & technical support to our discerning customers.
Social
Facebook
Youtube
Contact
sales@anirestech.com
+6012-498 3908
+6016-211 1918
+60389581918
+60389581916
Business Hour 8.30AM - 5.30PM (GMT +8)
© 2021, Anires Tech SDN BHD
200801018419 (819715-V)